![]() ![]() Beam properties correspond to the 2015-2018 period. Laue Microscopy is based on the collection of Laue pattern of scattered beams coming from white and microsized beam sample illumination. In addition, x-ray fluorescence mapping can be used for locating micro-markers on the sample when the microscope is retracted. Selected regions of interest on the sample surface can be finely aligned on the x-ray beam by means of an optical microscope featuring a 50X objective and a 12X zoom, low depth of focus (< 1 µm) and high lateral resolution (0.3µm). Larger counting times are needed for low Z materials, smaller grains ( 10 mrad/µm). A typical Laue pattern on a thick grain (>5µm) requires less than 0.5s counting time. 2020) thanks to EBS and new Rh-coated KBs: (hxv) =0.2x0.2 µm 2 and energy band 5-22 keV. Two fixed-curvature elliptical KB mirrors are used to achieve a sub-micronic (hxv) =0.3x0.3 µm 2 white beam with a X-ray energy range of 5 to 23 keV (adjustable) up to 2018. The enhanced station for Laue microdiffraction LaueMAX is coming soon! The microdiffraction setup is operational since 2006. ![]() Last 5 years Laue microdiffraction and LaueTools publications The page below gives main aspects of the technique. Please refer to cababilities described in our exhaustive last 5 years activity report. Presentation Poster of X-Ray Laue Microscopy (August 2023) Such instrument takes full profit from the white beam source of bending magnets. This dedicated setup is unique in Europe. Probing the local strain, shape (size, orientation) and composition of micro and nano materials is the main objective of our Laue micro-diffraction setup. The large demand for structural characterization of objects with ever decreasing sizes has driven the development of new methods to determine not only the average internal structure but also the local structure at submicron scale.
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